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Electron Beam Testing Technology

John T. L. Thong

1993462 pagesabout 7–11 hours
1993
first published
  • 1993Springer US · 462 pages · ENGISBN 9781489915221

This is the first comprehensive volume on electron beam testing for integrated circuits. Including introductory material, a guide to fundamentals, and an implementational section, the work will serve as a complete reference for both experienced practitioners as well as those unfamiliar with the technology.

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