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ESD

Steven H. Voldman

2005290 pagesabout 4–7 hours
2005
first published
  • 2005John Wiley & Sons · 398 pages · ENGISBN 9780470847558
  • 2006John Wiley & Sons, Ltd. · ENGISBN 9780470030066
  • 2006John Wiley & Sons, Ltd. · ENGISBN 9780470061398
  • 2006John Wiley · 412 pages · ENGISBN 9780470847541
  • 2009J. Wiley · ENGISBN 9780470511374
  • 2009Wiley & Sons, Incorporated, John · 408 pages · ENGISBN 9780470747261
  • 2011Wiley & Sons, Limited, John · 290 pages · ENGISBN 9781119991137
  • 2015Wiley · 544 pagesISBN 9781118954461

The scaling of semiconductor devices from sub-micron to nanometer dimensions is driving the need for understanding the design of electrostatic discharge (ESD) circuits, and the response of these integrated circuits (IC) to ESD phenomena. ESD Circuits and Devices provides a clear insight into the layout and design of circuitry for protection against electrical overstress (EOS) and ESD. With an emphasis on examples, this text: explains ESD buffering, ballasting, current distribution, design segmentation, feedback, coupling, and de-coupling ESD design methods; outlines the fundamental analytical models and experimental results for the ESD design of MOSFETs and diode semiconductor device elements, with a focus on CMOS, silicon on insulator (SOI), and Silicon Germanium (SiGe) technology; focuses on the ESD design, optimization, integration and synthesis of these elements and concepts into ESD networks, as well a...

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